About the Institute
The Texas A&M Institute of Data Science (TAMIDS) serves and fosters collaborations across the university and its affiliated agencies. TAMIDS is a joint undertaking of Texas A&M University with the Texas A&M Engineering Experiment Station (TEES) and Texas A&M AgriLife Research. TAMIDS is an inclusive umbrella organization for data science and will facilitate interactions between researchers in diverse application areas and those with expertise in core methodologies, promote education in data science across the university, and pursue outreach to commercial and governmental organizations in the wider data science ecosystem.
Director: Dr. Nick Duffield
Phone: (979) 845-7328
Duffield named director of Texas A&M Institute of Data Science
Nick Duffield, professor in the Department of Electrical and Computer Engineering, College of Engineering at Texas A&M University, is the new director of the Texas A&M Institute of Data Science (TAMIDS), the Division of Research announced today.
Before joining Texas A&M in 2014, Duffield was a Distinguished Member of Technical Staff and AT&T Fellow at AT&T Labs Research in Florham Park, N.J. He received his doctorate in physics from the University of London. He held academic positions in Europe before joining AT&T in 1995.
Duffield is an author or co-author on more than 160 publications in the areas of data science and computer networking. He holds 54 US patents and his work has been implemented in Internet systems, services and standards. His current research involves algorithms for data streaming and machine learning, computer-network measurement and resilience, and applications of data science to transportation, agriculture and hydrology. Duffield’s work at Texas A&M has received support from the National Science Foundation, DARPA, Google and Intel. He is a fellow of IEEE as well as the Institution of Engineering and Technology, and has twice received the Association for Computing Machinery (ACM) SIGMETRICS Test-of-Time award. He is an elected member of the governing board of ACM SIGMETRICS.